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Architecture Design for Soft Errors

   
지은이 Shubu Mukherjee   |   출판사 Morgan Kaufmann  |   발행일 2008년 03월 31일   |   언어 : English
 
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판매가 125,930원100,740원 20%
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발행일 2008-03-31 | 중량: 0.78 kg | 사이즈: 19.8*23.5*2.4 cm
ISBN 0123695295 |  9780123695291
기타정보 원서 | 360쪽 | $ 89.95 | Hardcover
예상입고일 10~15일 소요예정 (근무일기준)
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    Book Description

    Soft errors represent very tiny radioactive glitches that occor on microchips. These glitches can result in corrupt data, system malfunctions, and loss of system reliability. Fixing soft errors presents a considerable cost and challenge for chip manufacturers, and this book, Architecture Design for Soft Errors, describes architectural techniques used to tackle soft errors.

    To provide readers with a better grasp of the problem definition and solution space, this book delves into physics of soft errors and reviews current circuit and software mitigation techniques as well. This book covers the new methodologies for quantitative analysis of soft errors as well as novel cost-effective architectural techniques to mitigate them. This book also re-evaluates traditional solutions in the context of the new quantitative analysis.

  • Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them
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